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    Autor
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    cullis
    (1)
    li, tingkai
    (1)
    Schlagwort
    Schlagwort
    threading dislocation density
    (4)
    aln interlayer
    (2)
    basic physical and chemical properties
    (2)
    condensed matter
    (2)
    electronic materials characterization
    (2)
    electronics
    (2)
    gan and related alloys on silicon growth and integration techniques
    (2)
    gan hemt
    (2)
    materials and device integration processes with si microelect
    (2)
    physics
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    scanning probe methods
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    science
    (2)
    secondary ion mass spectroscopy
    (2)
    semiconductor device reliability
    (2)
    semiconductors
    (2)
    technology & engineering
    (2)
    advanced power transistors
    (1)
    advanced semiconductor microscopy applications
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    aln buffer layer
    (1)
    beam
    (1)
    cross sectional tem image
    (1)
    cross-section tem image
    (1)
    density
    (1)
    device material interfaces
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    dislocation
    (1)
    dislocations
    (1)
    eftem
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    electricity
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    electron microscopy techniques
    (1)
    electron probe analysis
    (1)
    electron spectroscopic imaging
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    elektronische geräte und materialien
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    energy filter tem
    (1)
    epi
    (1)
    epitaxial layer growth
    (1)
    fault
    (1)
    focused ion beam milling
    (1)
    gan layer
    (1)
    high resoluti
    (1)
    high resolution electron microscopy images
    (1)
    hrem image
    (1)
    inversion domain boundaries
    (1)
    lomer dislocation
    (1)
    luminescence analysis
    (1)
    materials micr
    (1)
    metalorganic vapour phase epitaxy
    (1)
    microelectronics
    (1)
    mikroskopie
    (1)
    molecular
    (1)
    nanostructure characterization
    (1)
    optoelectronic integrati
    (1)
    optoelectronic integration
    (1)
    quantum dot analysis
    (1)
    quantum nanostructures
    (1)
    rgb image
    (1)
    saed pattern
    (1)
    semiconductor microscopy techniques
    (1)
    silicon compound semiconductor integration
    (1)
    stacking
    (1)
    stacking fault
    (1)
    technology & industrial arts
    (1)
    tem image
    (1)
    threading
    (1)
    threading dislocation
    (1)
    threading dislocations
    (1)
    wafer stress measurement
    (1)
    Erscheinungsjahr
    Erscheinungsjahr
    2000
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