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    Autor
    Autor
    rodenburg
    (1)
    sakaki, h.
    (1)
    sir alan cottrell
    (1)
    Schlagwort
    Schlagwort
    stacking fault
    (4)
    physics
    (3)
    science
    (3)
    general
    (2)
    threading dislocations
    (2)
    adf image
    (1)
    advanced compound semiconductor device research
    (1)
    advanced electron optics
    (1)
    afm
    (1)
    alloy microstructure analysis
    (1)
    aln buffer layer
    (1)
    atomic theory
    (1)
    beam
    (1)
    buffer layer
    (1)
    bulk gan
    (1)
    cbed
    (1)
    cbed pattern
    (1)
    cellular dendrites
    (1)
    cementite plates
    (1)
    combustion chamber
    (1)
    condensed matter
    (1)
    crystal growth techniques
    (1)
    crystal lattice defects
    (1)
    dc current gain
    (1)
    density
    (1)
    dislocation
    (1)
    dislocations
    (1)
    eftem
    (1)
    elasticity theory
    (1)
    electricity
    (1)
    electron diffraction pat
    (1)
    electron energy - loss spectrum
    (1)
    electron energy loss spectroscopy
    (1)
    electron microscopes & microscopy
    (1)
    electron probe analysis
    (1)
    electron spectroscopic imaging
    (1)
    electronics
    (1)
    epi
    (1)
    etching rate
    (1)
    fault
    (1)
    fet
    (1)
    focused ion beam milling
    (1)
    gaas qw
    (1)
    gaas substrate
    (1)
    gan film
    (1)
    gan layer
    (1)
    gatan imaging filter
    (1)
    grey cast iron
    (1)
    haadf
    (1)
    hand-craft industry
    (1)
    hemt
    (1)
    hrem
    (1)
    iii-v semiconductors
    (1)
    inas dot
    (1)
    inp substrate
    (1)
    invariant plane strain
    (1)
    inversion domain boundaries
    (1)
    iron making blast furnace
    (1)
    lomer dislocation
    (1)
    low dimensional nanostructures
    (1)
    materials micr
    (1)
    materials microstructure analysis
    (1)
    materials science fundamentals
    (1)
    mbe
    (1)
    metallurgical thermodynamics
    (1)
    metallverarbeitung, metallurgie (hüttenwesen)
    (1)
    microscopes & microscopy
    (1)
    mocvd
    (1)
    molecular
    (1)
    movpe
    (1)
    optoelectronic transistors
    (1)
    phase transformation kinetics
    (1)
    pl intensity
    (1)
    qds
    (1)
    quantum nanostructures
    (1)
    qwr
    (1)
    rgb image
    (1)
    rheed
    (1)
    rheed pattern
    (1)
    scanning probe methods
    (1)
    scanning probe techniques
    (1)
    schottky barrier height
    (1)
    sea water
    (1)
    selected area diffraction patterns
    (1)
    sem
    (1)
    semiconductor ch
    (1)
    semiconductor microscopy techniques
    (1)
    semiconductors
    (1)
    silicon carbide devices
    (1)
    soli
    (1)
    spherical aberration
    (1)
    stacking
    (1)
    superimposed
    (1)
    surface science applications
    (1)
    technische anwendung von elektron
    (1)
    technology & engineering
    (1)
    theory of plasticity
    (1)
    thermodynamics
    (1)
    threading
    (1)
    threading dislocation density
    (1)
    Erscheinungsjahr
    Erscheinungsjahr
    1997
    (2)
    1999
    (1)
    2000
    (1)
    Ergebnis: 4 Artikel
    Schlagwort: stacking fault

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