The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about how to test semiconductor devices and systems. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Über den Autor
Niraj Jha is Professor of Electrical Engineering at Princeton University and head of the Center of Embedded System-on-a-Chip Design, where his current research is focussed on the synthesis and testing of these devices. He is a fellow of IEEE, associate editor of IEEE Transactions on VLSI Systems and The Journal of Electronic Testing: Theory and Applications (JETTA) and a recipient of the AT&T Foundation award and the NEC preceptorship award for research excellence.
Inhaltsverzeichnis
1. Introduction; 2. Fault models; 3. Combinational logic and fault simulation; 4. Test generation for combinational circuits; 5. Sequential ATPG; 6. IDDQ testing; 7. Functional testing; 8. Delay fault testing; 9. CMOS testing; 10. Fault diagnosis; 11. Design for testability; 12. Built-in self-test; 13. Synthesis for testability; 14. Memory testing; 15. High-level test synthesis; 16. System-on-a-chip testing; Index.
Klappentext
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide-ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through every key area, including detailed treatment of the latest techniques such as system-on-a-chip and IDDQ testing. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
