Über den Autor
Manjul Bhushan is a technical consultant in New York.
Mark Ketchen is a technical consultant in Massachusetts.
Introduction.- CMOS Circuit Basics.- CMOS Storage Elements and Synchronous Logic.- IDDQ and Power.- Embedded PVT Monitors.- Variability.- Product Chip Test and Characterization.- Reliability, Burn-In and Guardbands.- Data Analysis and Characterization.- CMOS Metrics and Model Evaluation.
CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.
Relates CMOS product performance to basic physical models of transistors and passive elements
Uses embedded test structures and sensors for product test debug, yield and performance evaluation
Describes impact of device variability
Discusses application corners, schmooing and product specifications including guardbands
Presents an overall view of CMOS product chip test, test equipment and diagnostic tools
Describes data analysis techniques for rapid evaluation and debug during test
Features nearly 300 illustrations