Introduction: Atom Probe Tomography.- Historical Development.- Underlying Physics.- Applications to Microstructural Characterization. Instrumentation: Local Electrode Atom Probe.- Voltage and Laser Pulsing Methods.- Nano-Positioning Stage.- Energy Compensation.- Field Ion microscopy.- Specimen Preparation.- Requirements.- Electropolishing.- FIB-Based Methods.- Specimen Failure Mechanisms.- Data Reconstruction: Raw Data Conversion.- Element Assignment of Micro/Nano, Mass Spectra, Molecular and Complex Ions.- Resolutions.- Preferential Evaporation and Retention.- Detection Efficiency.- Atom Maps.- Simulations.- Analysis of Data: Composition Determination, Standard Error, Smoothing Methods.- Local Order Methods.- Concentration Profiles.- Contingency Tables.- Binomial Distributions.- Friend-of-Friends and Nearest Neighbor Methods- Appendices.
Introduction to Atom Probe Tomography.- Introduction to the Physics of Field Ion Emitters.- Field Evaporation and Related Topics.- The Art of Specimen Preparation.- The Local Electrode Atom Probe.- Data Reconstruction.- Data Analysis.- Appendices.
Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography.
Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data reconstruction and visualization, statistical data analysis methods and specimen preparation by electropolishing and FIB-based techniques. A full description of the local electrode atom probe - a new state-of-the-art instrument - is also provided, along with detailed descriptions and limitations of laser pulsing as a method to field evaporate atoms. Valuable coverage of the new ionization theory is also included, which underpins the overall technique.
Serves as a practical guide for the operation of the technique and analysis of the data
Covers state-of-the-art instrumentation and theories
Includes new and revised data analysis methods and applications