1. X-Ray Diffraction and Reflectivity.- 2. Introduction to Optical Characterization of Materials.- 3. X-Ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES).- 4. Secondary Ion Mass Spectrometry.- 5. Transmission Electron Microscopy.
Practical Materials Characterization covers the most common materials analysis techniques in a single volume. It stands as a quick reference for experienced users, as a learning tool for students, and as a guide for the understanding of typical data interpretation for anyone looking at results from a range of analytical techniques. The book includes analytical methods covering microstructural, surface, morphological, and optical characterization of materials with emphasis on microscopic structural, electronic, biological, and mechanical properties. Many examples in this volume cover cutting-edge technologies such as nanomaterials and life sciences.
Presents cross-comparison between materials characterization techniques
Includes clear specifications of strengths and limitations of each technique for specific materials characterization problem
Focuses on applications and clear data interpretation without extensive mathematics