Introduction.- Silicon-based Frequency References.- Frequency References Based on the Thermal Properties of Silicon.-A Digitally-Assisted Electrothermal Frequency-Locked Loop in Standard CMOS.- An Electrothermal Frequency Reference in Standard 0.7µm CMOS.- A Scaled Electrothermal Frequency Reference in Standard 0.16µm CMOS.- Conclusions and Outlook.- Appendix.
This book describes an alternative method of realizing accurate on-chip frequency references in standard CMOS processes. This method exploits the thermal-diffusivity of silicon, i.e. the rate at which heat diffuses through a silicon substrate. This is the first book describing the design of such electrothermal frequency references. It includes the necessary theory, supported by practical realizations that achieve inaccuracies as low as 0.1% and thus demonstrate the feasibility of this approach. The book also includes several circuit and system-level solutions to the precision circuit design challenges encountered during the design of such frequency references.
Surveys the state-of-the-art in all-silicon frequency references
Examines the use of the well-defined thermal properties of silicon in generating accurate on-chip frequencies
Demonstrates simplified models that allow electronics engineers to simulate electrothermal elements in circuit simulators
Follows a top-down methodology in circuit design, in which system-level design is promoted by behavioral simulations