Über den Autor
Marcel Pelgrom received his B.EE, M.Sc, and PhD from Twente University, Enschede, The Netherlands. In 1979, he joined Philips Research Laboratories, where his research has covered topics such as Charge Coupled Devices, MOS matching properties, analog-to-digital conversion, digital image correlation, and various analog building block techniques. He has headed several project teams, and was a team leader for high-speed analog-to-digital conversion. From 1996 until 2003, he was a department head for Mixed-Signal Electronics.
In addition to various activities concerning industry-academic relations, he is a research fellow in research on the edge of design and technology.
In 2003, he spent a sabbatical in Stanford University where he served as a consulting professor. Since 2007, he has been a member of the technical staff at NXP Semiconductors. Dr. Pelgrom was an IEEE Distinguished Lecturer, has written over 40 publications, three book chapters, and holds 28 US patents. He currently lectures in the Philips Training Department at Twente University and for MEAD Inc.
Introduction.- Components and Definitions.- Sampling.- Sample and Hold.- Quantization.- Reference Circuits.- Digital-to-Analog Conversion.- Analog-to-Digital Conversion.- Sigma-Delta Modulation.- Characterization and Specification.- Technology.- System Aspects of Conversion.
Covers the most relevant developments in analog-to-digital conversion, in a pedagogical framework suited for both graduate-level courses and professionals
Updates the first edition of this book to include novel calibration concepts, the specific requirements of new systems, the consequences of 22-nm technology and the need for a more statistical approach to accuracy
Includes more than twice the exercises of the first edition, as well as solved examples to help introduce each new concept