Über den Autor
MiloS Stanisavljevic received the M.S. degree in electrical engineering from
the Faculty of Electrical Engineering, University of Belgrade, Belgrade, Serbia,
in 2004, and the Ph.D. degree in electrical engineering from the Swiss Federal
Institute of Technology (EPFL), Lausanne, Switzerland, in 2009. During
2004, he was an Analog Design and Layout Engineer for Elsys Design, Belgrade/
Texas Instruments, Nice. In the end of 2004, he joined Microelectronic
Systems Laboratory, EPFL, as a Research Assistant. During 2006, he was
with International Business Machines Corporation (IBM) Research, Zurich,
for six months, where he was involved in the project related to reliability emulation
in the state-of-the-art nanoscale CMOS technology. He is currently
engaged in the field of reliability and fault-tolerant design of nanometer-scale
systems. His current research interests include mixed-signal gate and system
level design, reliability evaluation, and optimization. Dr. Stanisavljevic received
a Scholarship for Students with Extraordinary Results Awarded by
the Serbian Ministry of Education from 1996 to 2004.
Alexandre Schmid received the M.S. degree in Microengineering and the
Ph.D. degree in Electrical Engineering from the Swiss Federal Institute of
Technology (EPFL) in 1994 and 2000, respectively. He has been with the
EPFL since 1994, working at the Integrated Systems Laboratory as a research
and teaching assistant, and at the Electronics Laboratories as a post-doctoral
fellow. He joined the Microelectronic Systems Laboratory in 2002 as a Senior
Research Associate, where he has been conducting research in the fields of
non-conventional signal processing hardware, nanoelectronic reliability, bioelectronic
and brain-machine interfaces. Dr. Schmid has published over 70
peer-reviewed journal and conference papers. He has served in the conference
committee of The International Conference on Nano-Networks since 2006, as
technical program chair in 2008, and general chair in 2009. Dr. Schmid is an
Associate Editor of the IEICE ELEX. Dr. Schmid is also teaching at the Microengineering
and Electrical Engineering Departments/Sections of EPFL.
Yusuf Leblebici received his B.Sc. and M.Sc. degrees in electrical engineering
from Istanbul Technical University, in 1984 and in 1986, respectively, and
his Ph.D. degree in electrical and computer engineering from the University
of Illinois at Urbana-Champaign (UIUC) in 1990. Between 1991 and 2001,
he worked as a faculty member at UIUC, at Istanbul Technical University,
and at Worcester Polytechnic Institute (WPI). In 2000-2001, he also served
as the Microelectronics Program Coordinator at Sabanci University.
Since 2002, Dr. Leblebici has been a Chair Professor at the Swiss Federal
Institute of Technology in Lausanne (EPFL), and director of Microelectronic
Systems Laboratory. His research interests include design of high-speed
CMOS digital and mixed-signal integrated circuits, computer-aided design of
VLSI systems, intelligent sensor interfaces, modeling and simulation of semiconductor
devices, and VLSI reliability analysis.
He is the coauthor of 4 textbooks, namely, Hot-Carrier Reliability of MOS
VLSI Circuits (Kluwer Academic Publishers, 1993), CMOS Digital Integrated
Circuits: Analysis and Design (McGraw Hill, 1st Edition 1996, 2nd Edition
1998, 3rd Edition 2002), CMOS Multichannel Single-Chip Receivers for
Multi-Gigabit Optical Data Communications (Springer, 2007) and Fundamentals
of High Frequency CMOS Analog Integrated Circuits (Cambridge
University Press, 2009), as well as more than 200 articles published in various
journals and conferences.
He has served as an Associate Editor of IEEE Transactions on Circuits and
Systems (II), and IEEE Transactions on Very Large Scale Integrated (VLSI)
Systems. He has also served as the general co-chair of the 2006 European
Solid-State Circuits Conference, and the 2006 European Solid State Device
Research Conference (ESSCIRC/ESSDERC). He is a Fellow of IEEE and
has been elected as Distinguished Lecturer of the IEEE Circuits and Systems
Society for 2010-2011.
Introduction.- Reliability, Faults and Fault Models.- Nanotechnology and Nanodevices.- Fault-Tolerant Architectures and Approaches.- Reliability Evaluation Techniques.- Averaging Design Implementations.- Statistical Evaluation of Fault-Tolerance Using Proability Density Functions.- System Level Reliability Evaluation and Optimization.- Summary and Conclusions.- References.
This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.