Preface.- Difficulties of Defect Monitoring at its Origin and its Dataware Features.- Position-Binary Technology of Monitoring Defect at its Origin.- Technology of Digital Analysis of Noise as a Carrier of Information about the Beginning of Defect Origin.- Robust Correlation Monitoring of a Defect at its Origin.- Spectral Monitoring of Defect Origin.- Digital Technology of Forecasting Failures by Considering Noise as a Data Carrier.- Technology of Monitoring Defect Origin by Considering Noise as a Data Carrier.
This book explores the initial stage of the origin of the defect taking into account technical, biological, and other features of several technologies. These technologies allow the defect monitoring at the beginning of the defect origin to be performed at the expense of extracting information from the noise. This book appeals to a wide audience focused on solving numerous problems.
Includes several technologies that cover the initial stage of the origin of the defect
Theoretically proves the various technologies
Exemplifies the applications for solving problems concerning noise monitoring at the beginning of the defect origin