Introduction.- Part I: Sources of Variability.- Front End Variability.- Back End Variability.- Environmental Variability.- Part II: Variability Characterization and Analysis.- Test Structures for Variability.- Statistical Foundations of Data Analysis and Modeling.- Part III: Design Techniques for Systematic Manufacturability Problems.- Lithography Enhancement Techniques.- Ensuring Interconnect Planarity.- Part IV: Statistical Circuit Design.- Statistical Circuit Analysis.- Statistical Static Timing Analysis.- Leakage Variability and Joint Parametric Yield.- Parametric Yield Optimization.- Conclusions.
Design for Manufacturability and Statistical Design: A Comprehensive Approach presents a comprehensive overview of methods that need to be mastered in understanding state-of-the-art design for manufacturability and statistical design methodologies. Broadly, design for manufacturability is a set of techniques that attempt to fix the systematic sources of variability, such as those due to photolithography and CMP. Statistical design, on the other hand, deals with the random sources of variability. Both paradigms operate within a common framework, and their joint comprehensive treatment is one of the objectives of this book and an important differentation.
Unified Treatment of Data Collection, Modeling, and Statistical CAD
Covers From Fabrication to Design to CAD
Deals With the Extraction of Fab Information into distrubutions for analysis
Circuit Structures and Techniques to Reduce On-Chip Variability
Using CAD for the Analysis and Optimization of Timing and Power