1- Space Radiation Environment, J.-C. Boudenot (THALES) 2- Radiation Effects in Microelectronics, R. Schrimpf (Vanderbilt Univ. ) 3- In-Flight Anomalies on Electronic Devices, R. Ecoffet (CNES) 4- Multi-Level Fault Effects Evaluation, L. Anghel (TIMA), M. Rebaudengo, M. Sonza Reorda, M. Violante (POLI Torino) 5- Effects of Radiation on Analog & Mixed-Signal Circuits, M. Lubaszewski, T. Balen, E. Schuler, L.Carro (UFRGS), J.L. Huertas (IMSE-CNM) 6- Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing , P. Fouillat, V. Pouget (IXL), D. McMorrow (NRL). F. Darracq (IXL), S. Buchner (QSS), D. Lewis (IXL) 7- Design Hardening Methodologies for ASICs , F. Faccio (CERN) 8- Fault Tolerance in Programmable Circuits, F. Kastensmidt (UFRGS) & R. Reis (UFRGS) 9- Automatic Tools for Design Hardening, C. Lopez-Ongill, L. Entrena, M. Gracia-Valderas, M. Portela-Garcia (Univ. Carlos III) 10- Test Facilities for SEE and Dose Testing, S. Duzellier (ONERA) and G. Berger (UCL) 11- Error Rate Prediction of Digital Architectures: Test Methodology and Tools, R. Velazco, F, Faure (TIMA) 12- Using the SEEM Software for Laser SET Testing and Analysis, V. Pouget, P. Fouillat, D. Lewis (IXL)
Aims at providing the reader with the major guidelines for coping with radiation effects on components supposed to be included in modern application devoted to operate in space, but also in the atmosphere at high altitude or at ground level. This book provides IC engineers with information regarding outside influences on their designs.
Provides an extensive overview of radiation effects on integrated circuits
Coverage of space radiation effects
Design hardening methodologies
Simulation techniques of the transient effects of radiation on integrated circuits
Methodology and tools for radiation ground testing on circuits and systems
Qualification of circuits and systems for space applications