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Autor
adams, brent l.
(2)hawkes, p. w.
(2)kumar, mukul
(2)patrick echlin
(2)r.f. egerton
(2)schwartz, adam j.
(2)spence, john c.h.
(2)a. polliack
(1)agarwal, arvind
(1)allegra, luigi
(1)arvind agarwal
(1)b. butterfield
(1)benjamin boesl
(1)benoit, daniele
(1)boesl, benjamin
(1)braga, pier c.
(1)bresse, jean-francois
(1)charles e. lyman
(1)cowin, stephen c.
(1)dack, luc van't
(1)dale e. newbury
(1)david c. joy
(1)elias, hans
(1)eric lifshin
(1)eugene rochow
(1)field, david
(1)goldstein, joseph
(1)hermann riedel
(1)huyghe, jacques m.
(1)j.r. michael
(1)joseph goldstein
(1)kenichi shimizu
(1)krolczyk, grzegorz
(1)laura e. reuss
(1)linda sawyer
(1)ludwig reimer
(1)mccall, j.
(1)michael j. dykstra
(1)mittal, kashmiri l.
(1)n. n. sheftal'
(1)nautiyal, pranjal
(1)prakash, chander
(1)pramanik, alokesh
(1)pranjal nautiyal
(1)raats, peter a. c.
(1)singh, sunpreet
(1)tomoaki mitani
(1)williams, k. r.
(1)yasuo harada
(1)Verlag / Hersteller
springer berlin heidelberg
(5)springer international publishing
(3)springer nature singapore
(2)springer netherlands
(4)springer new york
(2)springer us
(11)Verlag
springer berlin heidelberg
(5)springer international publishing
(4)springer nature singapore
(2)springer netherlands
(4)springer new york
(2)springer us
(11)Schlagwort
scanning electron microscope
(30)
scanningelectronmicroscope
(30)electron microscope
(21)electronmicroscope
(20)fertigungstechnik
(17)maschinenbau
(17)technik
(17)microscopy
(14)electron microscopy
(12)transmissionelectronmicroscopy
(8)microscope
(7)transmission electron microscopy
(7)electronmicroscopy
(6)scanning transmission electron microscope
(6)spectroscopy
(6)biologicalmicroscopy
(5)scanningtransmissionelectronmicroscope
(5)werkstoffprüfung
(5)astronomie
(4)characterization and evaluation of materials
(4)crystallography
(4)life sciences
(4)material
(4)materials science
(4)materialsscience
(4)materialwissenschaft
(4)optical microscope
(4)opticalmicroscope
(4)physik
(4)ceramics
(3)crystal
(3)diffraction
(3)electron
(3)electron diffraction
(3)electrondiffraction
(3)electrons
(3)fatigue
(3)medizin
(3)metals
(3)mikroskopie
(3)preparation
(3)scanning
(3)solid state physics
(3)structure
(3)surfaces and interfaces, thin films
(3)transmission
(3)transmission electron micr
(3)allgemeines
(2)analytical electron microscopy
(2)analyticalelectronmicroscopy
(2)atomphysik
(2)backscattered electron generation
(2)backscatteredelectrongeneration
(2)biologie
(2)biology
(2)cell
(2)characterization and analytical technique
(2)characterization and e
(2)chemie
(2)coating
(2)computational intelligence
(2)computationalintelligence
(2)control
(2)corrosion
(2)crack
(2)development
(2)ebsd explained
(2)ebsdexplained
(2)elastic strains
(2)electromechanical characterization
(2)electromechanicalcharacterization
(2)electron microscopy textbook
(2)electronelectrons
(2)electronmicroscopytextbook
(2)focused ion beam machining
(2)focusedionbeammachining
(2)geisteswissenschaften allgemein
(2)glass
(2)grain boundaries
(2)growth
(2)humanities and social sciences
(2)icfmmp 2019
(2)icfmmp2019
(2)in-situ microscopy
(2)in-situ tribology
(2)in-situmicroscopy
(2)in-situtribology
(2)information
(2)instruments
(2)interdisziplinäre studien
(2)iron
(2)kernphysik
(2)kltcatalog
(2)lexika
(2)life sciences, general
(2)lifesciences
(2)manufacturing, machines, tools, processes
(2)materials characterization
(2)materials characterization technique
(2)materialscharacterization
(2)Erscheinungsjahr
1967
(1)1996
(1)2005
(2)2006
(1)2009
(1)2010
(2)2011
(5)2012
(7)2013
(2)2014
(1)2016
(2)2018
(1)2020
(2)2021
(2)Ergebnis: 30 Artikel
Schlagwort: scanningelectronmicroscope
