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Autor
alfred x. trautwein
(2)chandan das
(2)darren p. broom
(2)david a. porter (university of oulu, finland)
(2)dr robert keyse
(2)eckhard bill
(2)elaine a. moore (the open university, milton keynes, uk)
(2)jennifer readman (university of central lancashire)
(2)john humphreys
(2)kenneth e. easterling (university of exeter, uk)
(2)mohamed y. sherif
(2)peter j. goodhew
(2)philipp gütlich
(2)scott calvin (lehman college, new york; sarah lawrence college, bronxville, new york, usa)
(2)sujoy bose
(2)tadeusz burakowski
(2)tadeusz wierzchon
(2)a.a. aksenov (moscow state institute of steel and alloys, russia)
(1)anirban banerjee
(1)chi, dongzhi
(1)colomban, philippe
(1)delhaes, pierre
(1)dmitry g. eskin (brunel university, uxbridge, uk)
(1)edwards, howell g. m.
(1)fitzpatrick, m. e.
(1)howell g. m. edwards
(1)john d. wright (formerly of university of kent, england, uk)
(1)l.l. rokhlin (the baikov institute of metallurgy, moscow, russia)
(1)leszek wojnar
(1)lodini, a.
(1)lodini, alain
(1)n.a. belov (moscow state institute of steel and alloys, russia)
(1)nico a.j.m. sommerdijk (eindhoven university of technology, the netherlands)
(1)p.e. champness
(1)peter vandenabeele
(1)philippe colomban
(1)pj goodhew
(1)primel, louis
(1)r. brydson
(1)raj, baldev
(1)terry gladman
(1)vandenabeele, peter
(1)yuri m. tsipenyuk
(1)Verlag / Hersteller
crc press
(34)elsevier science
(2)springer berlin heidelberg
(2)springer london
(2)Verlag
crc press
(34)elsevier science
(2)springer
(2)springer berlin heidelberg
(2)springer international publishing
(2)springer london
(2)springer, berlin
(2)Schlagwort
materials characterisation
(44)technology & engineering
(17)materials science
(9)electron microscopy techniques
(6)general
(6)metallverarbeitung, metallurgie (hüttenwesen)
(6)science
(6)technology & industrial arts
(6)biotechnology
(5)cbed pattern
(5)medical
(5)mikroskopie
(5)materialscharacterisation
(4)microstructure analysis
(4)physics
(4)anorganische chemie
(3)beam current
(3)civil
(3)computational modelling
(3)engineering (general)
(3)environmental impact assessment
(3)kikuchi lines
(3)method
(3)reciprocal lattice
(3)spektroskopie, spektrochemie, massenspektrometrie
(3)supercritical
(3)transmission electron microscope
(3)university
(3)aaa
(2)aberration
(2)adf
(2)advanced solid state materials applications
(2)advanced steel processing
(2)advanced surface layer modelling
(2)advanced x-ray spectroscopy applications
(2)alternative und erneuerbare energien und technik
(2)analytical chemistry
(2)analytical electron methods
(2)analytical spectral data interpretation
(2)analytische chemie
(2)aneurysm sac
(2)annular dark field image
(2)annular dark field stem
(2)annular dark field stem image
(2)apa
(2)archaeology and artworks
(2)bainitic ferrite
(2)beam
(2)bf detector
(2)biological and environmental deterioration
(2)biomechanics applications
(2)biomedical
(2)biomedical engineering
(2)bioscience imaging applications
(2)bright field stem image
(2)c
(2)catalysis research tools
(2)cct diagram
(2)ceramic processing for engineering applications
(2)characterization and analytical technique
(2)characterization and evaluation of materials
(2)chemie
(2)collector aperture
(2)composite material testing
(2)computational modelling alloys
(2)condensed matter physics
(2)condenser lens
(2)convergence angle
(2)cop displacement
(2)cultural heritage preservation
(2)dec.
(2)dedicated stems
(2)defect chemistry
(2)dielectric behaviour
(2)diffraction
(2)diffraction analysis
(2)diffusion
(2)diffusion processes
(2)diffusionless transformation mechanisms
(2)electrical resistivity
(2)electron
(2)electron energy loss spectroscopy
(2)electronic band structure
(2)electronic, optical & magnetic materials
(2)electronics instrumentation
(2)element
(2)energietechnik
(2)energietechnik, elektrotechnik und energiemaschinenbau
(2)energy grids and networks
(2)energy policy, economics and management
(2)energy science and technology
(2)energy storage
(2)energy storage materials
(2)energy systems
(2)engineering
(2)environment and materials science
(2)environmental spectroscopy
(2)evar
(2)everhart thornley detector
(2)ewald sphere
(2)Erscheinungsjahr
1984
(1)1996
(1)1997
(1)1998
(2)2000
(4)2001
(2)2002
(1)2003
(2)2004
(1)2010
(1)2011
(3)2013
(1)2014
(1)2015
(1)2016
(2)2017
(1)2018
(1)2019
(3)2020
(3)2021
(2)2022
(1)2023
(2)2024
(3)2025
(2)2026
(2)Ergebnis: 44 Artikel
Schlagwort: materials characterisation
