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Verlag / Hersteller
springer berlin heidelberg
(2)springer international publishing
(2)Schlagwort
sonstiges
(4)technik
(4)andere fertigungsverfahren
(2)atom manipulation
(2)atomic
(2)atomic and molecular imaging
(2)atomic force microscopy
(2)atomic resolution
(2)atomic scale magnetic imaging
(2)atomic/molecular manipulation
(2)atomicandmolecularimaging
(2)atomicresolution
(2)atomicscalemagneticimaging
(2)chemical identification
(2)chemical structure
(2)chemicalidentification
(2)chemicalstructure
(2)elektronik
(2)force mapping with atomic resolution
(2)force spectroscopy and mapping
(2)forcemappingwithatomicresolution
(2)forcespectroscopyandmapping
(2)liquid
(2)liquid afm
(2)liquidafm
(2)magnetic exchange force microscopy
(2)magneticexchangeforcemicroscopy
(2)microscopy
(2)mikroskopie
(2)modeling
(2)molecularmanipulation
(2)nanotechnology
(2)nanotechnology and microengineering
(2)scanning probe techniques
(2)scanning tunneling microscopy
(2)scanningprobetechniques
(2)spectroscopy
(2)spectroscopy and microscopy
(2)spektroskopie
(2)tuning fork
(2)tuningfork
(2)atomicforcemicroscopy
(1)atommanipulation
(1)engineering,
(1)nanosca
(1)nanotec
(1)nanotechnologie
(1)scanningtunnel
(1)scanningtunnelingmicroscopy
(1)technologie
(1)theoretical and a
(1)theoretical and applied mechanics
(1)Ergebnis: 4 Artikel
Redaktion: franz j. giessibl
