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Autor
meyer, ernst
(7)
morita, seizo
(3)wiesendanger, roland
(3)giessibl, franz j.
(2)assmann, wilhelm august gottlieb
(1)bennewitz, roland
(1)gnecco, enrico
(1)hug, hans j.
(1)Schlagwort
atomic force microscopy
(3)atomicforcemicroscopy
(3)general
(3)scanning tunneling microscopy
(3)sonstiges
(3)technik
(3)atom manipulation
(2)atomic
(2)atomic resolution
(2)atomic/molecular manipulation
(2)atomicresolution
(2)atommanipulation
(2)chemical structure
(2)chemicalstructure
(2)force mapping with atomic resolution
(2)forcemappingwithatomicresolution
(2)liquid afm
(2)liquidafm
(2)magnetic exchange force microscopy
(2)magneticexchangeforcemicroscopy
(2)molecularmanipulation
(2)nanotechnologie
(2)scanning probe techniques
(2)scanningtunnelingmicroscopy
(2)science
(2)afm
(1)akustik
(1)astronomie
(1)bias
(1)characterization and evaluation
(1)contact force microscopy
(1)contactforcemicroscopy
(1)deformation
(1)elektronenmikroskopie - raster-tunnel-mikroskopie
(1)experiment
(1)friction force microscopy
(1)frictionforcemicroscopy
(1)helium-atom-streuung
(1)high-speed imaging of biological matter
(1)high-speedimagingofbiologicalmatter
(1)introduction to stm techniques
(1)introductiontostmtechniques
(1)literary collections
(1)magnetic force microscopy
(1)magneticforcemicroscopy
(1)measurement
(1)measurement science and instrumentation
(1)mechanik
(1)microscopy
(1)mikroskopie
(1)nanosca
(1)nanotec
(1)nanotechnology
(1)noncontact atomic
(1)noncontactatomic
(1)oxides
(1)physics
(1)physik
(1)scanningprobetechniques
(1)semiconductor
(1)semiconductors
(1)spectroscopy
(1)spektroskopie
(1)surface
(1)surfaces and interfaces, thin films
(1)tapping mode force microscopy
(1)tappingmodeforcemicroscopy
(1)technologie
(1)temperature
(1)true atomic resolution
(1)trueatomicresolution
(1)Ergebnis: 7 Artikel
Autor: meyer, ernst
